Blog

A primer on S-parameters and Touchstone files — why scattering parameters exist, what each term of the matrix means, reference impedance, the dB and magnitude-angle conventions, mixed-mode parameters for differential pairs, the Touchstone file format including the two-port ordering trap, and the passivity, reciprocity and causality checks every file should pass. Read More

The silicon power workflow — where dynamic and leakage power come from, the activity problem that makes every estimate uncertain, power intent in UPF, clock gating, power gating, DVFS and multi-Vt, and how power estimation, IR drop and thermal feed back into each other. What each step catches and which tool does it. Read More

The on-die signal-integrity workflow — parasitic extraction, crosstalk-aware static timing, noise and glitch signoff, signal electromigration, on-die inductance, and package co-simulation. What each step catches, which tool does it, and the physics that makes on-die SI a different problem from board SI. Read More